Publication Date |
2002 |
Personal Author |
Willis, R. D.; Blanchard, F. T.; Conner, T. L. |
Page Count |
128 |
Abstract |
Scanning Electron Microscopy (SEM) coupled with Energy-Dispersive X-ray analysis (EDX) is a powerful tool in the characterization and source apportionment of environmental particulate matter (PM), providing use, chemistry, and morphology of particles as small as a few tenths of a micron. Such information can reveal information about emission sources which cannot be determined through bulk chemical analysis. Automated SEMs capable of routinely analyzing hundreds of particles per hour have dramatically increased the throughput of SEM/EDX, making it feasible to conduct statistically meaningful analyses of PM samples and to generate large data sets for source apportionment studies. The National Exposure Research Laboratory (NERL) of the U.S. EPA has been developing and evaluating the use of SEM/EDX to characterize ambient and source-derived particles. The present document, which evolved over several years as a product of research carried out in support of the U.S. EPA/NERL SEM/EDX Laboratory, is intended to provide guidelines for researchers using SEM/EDX for aerosol characterization and source apportionment. Topics include laboratory procedures for sample handling, sample preparation, guidelines for successful manual and automated SEM/EDX analyses, data interpretation, issues relating to data quality and method validation, and case studies highlighting the use of SEM/EDX in PM research. |
Keywords |
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Source Agency |
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Corporate Authors |
ManTech Environmental Technology, Inc., Research Triangle Park, NC.; Environmental Protection Agency, Research Triangle Park, NC. National |
Supplemental Notes |
This document is color dependent and/or in landscape layout. It is currently available on CD-ROM and paper only. CD-ROM contains a 128 page document. Sponsored by Environmental Protection Agency, Research Triangle Park, NC. National Exposure Research Lab. |
Document Type |
Technical Report |
NTIS Issue Number |
200407 |