| Abstract |
In the present work, we study, via force microscopy, the basic physical interactions of a single bead of silica filler with a PDMS matrix both before and after exposure to gamma radiation. Our goal was to confirm our results from last year, and to explore force microscopy as a means of obtaining particle-scale polymer/filler interactions suitable for use as empirical inputs to a computational model consisting of an ensemble of silica beads embedded in a PDMS matrix. Through careful calibration of a conventional atomic force microscope, we obtained both normal and lateral force data that was fitted to yield adhesion, surface shear modulus, and friction of a 1 im silica bead in contact with PDMS layers of various thickness. Comparison of these terms before and after gamma exposure indicated that initially, radiation exposure lead to softening of the PDMS, but eventually resulted in stiffening. Simultaneously, adhesion between the polymer and silica decreased. This could indicate a serious failure path for filled PDMS exposed to radiation, whereby stiffening of the bulk polymer leads to loss of compressive elastic behavior, while a decrease in polymer filler adhesion results in an increased likelihood of stress failure under load. In addition to further testing of radiation damaged polymers, we also performed FEA modeling of silica beads in a silicone matrix using the shear modulus and adhesion values isolated from the force microscopy experiments as model inputs. The resulting simulation indicated that as a polymer stiffens due to impinging radiation, it also undergoes weakening of adhesion to the filler. The implication is that radiation induces a compound failure mode in filled polymer systems. |
