Publication Date |
2008 |
Personal Author |
Geisz, J. F.; Kurtz, S. R.; Wanlass, M. W.; Ward, J. S.; Duda, A. |
Page Count |
38 |
Abstract |
We demonstrate high efficiency performance in two ultra-thin, Ge-free III-V semiconductor triple-junction solar cell device designs grown in an inverted configuration. Low-stress metamorphic junctions were engineered to achieve excellent photovoltaic performance with less than 3 x 106 cm-2 threading dislocations. The first design with band gaps of 1.83/1.40/1.00 eV, containing a single metamorphic junction, achieved 33.8% and 39.2% efficiencies under the standard one-sun global spectrum and concentrated direct spectrum at 131 suns, respectively. The second design with band gaps of 1.83/1.34/0.89 eV, containing two metamorphic junctions achieved 33.2% and 40.1% efficiencies under the standard one-sun global spectrum and concentrated direct spectrum at 143 suns, respectively. |
Keywords |
|
Source Agency |
|
Corporate Authors |
National Renewable Energy Lab., Golden, CO. |
Supplemental Notes |
Presented at 33rd IEEE Photovoltaic Specialists Conference, San Diego, 2008. |
Document Type |
Technical Report |
NTIS Issue Number |
200908 |