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Stress Induced Degradation Modes in CIGSS Minimodules (Presentation).


DE2008939517

Publication Date 2008
Personal Author Kempe, M. D.; Terwilliger, F.; Tarrant, D.
Page Count 18
Abstract The experimental objectives of this report are: (1) compare the performance of modules exposed to high temperature and humidity; (2) determine the effects of different encapsulants on long term stability of CIGSS modules; and (3) analyze failure modes to determine areas in need of improvement.
Keywords
  • Photovoltaic cells
  • Degradation
  • Copper
  • Indium
  • Stresses
  • Humidity
  • Exposure
  • Stability
  • Encapsulation
  • Performance evaluation
  • Copper indium diselenide(CIGSS)
Source Agency
  • Technical Information Center Oak Ridge Tennessee
Corporate Authors National Renewable Energy Lab., Golden, CO.; Department of Energy, Washington, DC.
Supplemental Notes Sponsored by Department of Energy, Washington, DC.
Document Type Technical Report
NTIS Issue Number 200909
Contract Number
  • DE-AC36-99-GO10337
Stress Induced Degradation Modes in CIGSS Minimodules (Presentation).
Stress Induced Degradation Modes in CIGSS Minimodules (Presentation).
DE2008939517

  • Photovoltaic cells
  • Degradation
  • Copper
  • Indium
  • Stresses
  • Humidity
  • Exposure
  • Stability
  • Encapsulation
  • Performance evaluation
  • Copper indium diselenide(CIGSS)
  • Technical Information Center Oak Ridge Tennessee
  • DE-AC36-99-GO10337
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