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Damp-Heat Induced Degradation of Transparent Conducting Oxides for Thin Film Solar Cells.

DE2008939498

Publication Date	2008
Personal Author	Pern, J.; Noufi, R.; Li, X. N.; DeHart, C.; To, B.
Page Count	20
Abstract	The objectives are: (1) To achieve a high long-term performance reliability for the thin-film CIGS PV modules with more stable materials, device structure designs, and moisture-resistant encapsulation materials and schemes; (2) to evaluate the DH stability of various transparent conducting oxides (TCOs); (3) to identify the degradation mechanisms and quantify degradation rates; (4) to seek chemical and/or physical mitigation methods, and explore new materials. It's important to note that direct exposure to DH represents an extreme condition that a well-encapsulated thin film PV module may never experience.
Keywords	Solar energy Materials science Encapsulation Mitigation Oxides Performance Reliability Solar cells Stability Thin films
Source Agency	Technical Information Center Oak Ridge Tennessee
Corporate Authors	National Renewable Energy Lab., Golden, CO.; Department of Energy, Washington, DC.
Supplemental Notes	Sponsored by Department of Energy, Washington, DC.
Document Type	Technical Report
NTIS Issue Number	200910

Damp-Heat Induced Degradation of Transparent Conducting Oxides for Thin Film Solar Cells.

Damp-Heat Induced Degradation of Transparent Conducting Oxides for Thin Film Solar Cells.
DE2008939498

Publication Date	2008
Personal Author	Pern, J.; Noufi, R.; Li, X. N.; DeHart, C.; To, B.
Page Count	20
Abstract	The objectives are: (1) To achieve a high long-term performance reliability for the thin-film CIGS PV modules with more stable materials, device structure designs, and moisture-resistant encapsulation materials and schemes; (2) to evaluate the DH stability of various transparent conducting oxides (TCOs); (3) to identify the degradation mechanisms and quantify degradation rates; (4) to seek chemical and/or physical mitigation methods, and explore new materials. It's important to note that direct exposure to DH represents an extreme condition that a well-encapsulated thin film PV module may never experience.
Keywords	Solar energy Materials science Encapsulation Mitigation Oxides Performance Reliability Solar cells Stability Thin films
Source Agency	Technical Information Center Oak Ridge Tennessee
Corporate Authors	National Renewable Energy Lab., Golden, CO.; Department of Energy, Washington, DC.
Supplemental Notes	Sponsored by Department of Energy, Washington, DC.
Document Type	Technical Report
NTIS Issue Number	200910