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Damp-Heat Induced Degradation of Transparent Conducting Oxides for Thin Film Solar Cells.


DE2008939498

Publication Date 2008
Personal Author Pern, J.; Noufi, R.; Li, X. N.; DeHart, C.; To, B.
Page Count 20
Abstract The objectives are: (1) To achieve a high long-term performance reliability for the thin-film CIGS PV modules with more stable materials, device structure designs, and moisture-resistant encapsulation materials and schemes; (2) to evaluate the DH stability of various transparent conducting oxides (TCOs); (3) to identify the degradation mechanisms and quantify degradation rates; (4) to seek chemical and/or physical mitigation methods, and explore new materials. It's important to note that direct exposure to DH represents an extreme condition that a well-encapsulated thin film PV module may never experience.
Keywords
  • Solar energy
  • Materials science
  • Encapsulation
  • Mitigation
  • Oxides
  • Performance
  • Reliability
  • Solar cells
  • Stability
  • Thin films
Source Agency
  • Technical Information Center Oak Ridge Tennessee
Corporate Authors National Renewable Energy Lab., Golden, CO.; Department of Energy, Washington, DC.
Supplemental Notes Sponsored by Department of Energy, Washington, DC.
Document Type Technical Report
NTIS Issue Number 200910
Damp-Heat Induced Degradation of Transparent Conducting Oxides for Thin Film Solar Cells.
Damp-Heat Induced Degradation of Transparent Conducting Oxides for Thin Film Solar Cells.
DE2008939498

  • Solar energy
  • Materials science
  • Encapsulation
  • Mitigation
  • Oxides
  • Performance
  • Reliability
  • Solar cells
  • Stability
  • Thin films
  • Technical Information Center Oak Ridge Tennessee
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