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Advanced Modeling and Simulation to Design and Manufacture High Performance and Reliable Advanced Microelectronics and Microsystems.


DE2007913216

Publication Date 2007
Personal Author Ewsuk, K. G.; Hinklin, T.; Neilsen, M.; Tandon, R.; Arguello, J. G.
Page Count 97
Abstract An interdisciplinary team of scientists and engineers having broad expertise in materials processing and properties, materials characterization, and computational mechanics was assembled to develop science-based modeling/simulation technology to design and reproducibly manufacture high performance and reliable, complex microelectronics and microsystems. The teams efforts focused on defining and developing a science-based infrastructure to enable predictive compaction, sintering, stress, and thermomechanical modeling in real systems, including: (1) developing techniques to and determining materials properties and constitutive behavior required for modeling; (2) developing new, improved/updated models and modeling capabilities, (3) ensuring that models are representative of the physical phenomena being simulated; and (4) assessing existing modeling capabilities to identify advances necessary to facilitate the practical application of Sandia's predictive modeling technology.
Keywords
  • Microsystems
  • Integrated circuits
  • Thermomechanical properties
  • Simulation
  • Modeling
  • Materials research
  • Infrastructures
  • Compaction
  • Sintering
  • Models
  • Stress
  • Performance evaluations
  • Reliability
Source Agency
  • Technical Information Center Oak Ridge Tennessee
Corporate Authors Sandia National Labs., Albuquerque, NM.; Department of Energy, Washington, DC.
Supplemental Notes Sponsored by Department of Energy, Washington, DC.
Document Type Technical Report
NTIS Issue Number 200802
Advanced Modeling and Simulation to Design and Manufacture High Performance and Reliable Advanced Microelectronics and Microsystems.
Advanced Modeling and Simulation to Design and Manufacture High Performance and Reliable Advanced Microelectronics and Microsystems.
DE2007913216

  • Microsystems
  • Integrated circuits
  • Thermomechanical properties
  • Simulation
  • Modeling
  • Materials research
  • Infrastructures
  • Compaction
  • Sintering
  • Models
  • Stress
  • Performance evaluations
  • Reliability
  • Technical Information Center Oak Ridge Tennessee
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