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Contaminant Analysis of Polycrystalline and Single Crystal Niobium Used in Accelerator Cavities.

DE2005859453

Publication Date	2005
Personal Author	Stevie, F. A.; Zhu, Z.; Griffis, D. P.; Myneni, G. R.; Kneisel, P.
Page Count	8
Abstract	Secondary Ion Mass Spectrometry (SIMS) can characterize the surface and near surface of Nb used in accelerator cavities. Results show Nb oxide in the 2-3 nm range, a depleted H concentration in the oxide compared with the bulk, and N, C, O lower in an annealed single crystal sample than several polycrystalline samples. Other metallic contaminants are primarily at the surface, but tantalum is distributed uniformly through the material.
Keywords	Niobium Accelerators Mass spectrometry Oxides Contaminants Monocrystals
Source Agency	Technical Information Center Oak Ridge Tennessee
Corporate Authors	Thomas Jefferson National Accelerator Facility, Newport News, VA.; Department of Energy, Washington, DC.; North Carolina State Univ. at Raleigh.
Supplemental Notes	Prepared in cooperation with North Carolina State Univ. at Raleigh. Sponsored by Department of Energy, Washington, DC.
Document Type	Technical Report
NTIS Issue Number	200612

Contaminant Analysis of Polycrystalline and Single Crystal Niobium Used in Accelerator Cavities.

Contaminant Analysis of Polycrystalline and Single Crystal Niobium Used in Accelerator Cavities.
DE2005859453

Publication Date	2005
Personal Author	Stevie, F. A.; Zhu, Z.; Griffis, D. P.; Myneni, G. R.; Kneisel, P.
Page Count	8
Abstract	Secondary Ion Mass Spectrometry (SIMS) can characterize the surface and near surface of Nb used in accelerator cavities. Results show Nb oxide in the 2-3 nm range, a depleted H concentration in the oxide compared with the bulk, and N, C, O lower in an annealed single crystal sample than several polycrystalline samples. Other metallic contaminants are primarily at the surface, but tantalum is distributed uniformly through the material.
Keywords	Niobium Accelerators Mass spectrometry Oxides Contaminants Monocrystals
Source Agency	Technical Information Center Oak Ridge Tennessee
Corporate Authors	Thomas Jefferson National Accelerator Facility, Newport News, VA.; Department of Energy, Washington, DC.; North Carolina State Univ. at Raleigh.
Supplemental Notes	Prepared in cooperation with North Carolina State Univ. at Raleigh. Sponsored by Department of Energy, Washington, DC.
Document Type	Technical Report
NTIS Issue Number	200612