National Technical Reports Library

The National Technical Information Service acquires, indexes, abstracts, and archives the largest collection of U.S. government-sponsored technical reports in existence. The NTRL offers online, free and open access to these authenticated government technical reports. Technical reports and documents in its repository may be available online for free either from the issuing federal agency, the U.S. Government Publishing Office’s Federal Digital System website, or through search engines.

Details

Atomic-Resolution 3D Electron Microscopy with Dynamic Diffraction.

DE2005842049

Publication Date	2005
Personal Author	O'Keefe, M.; Downing, K. H.; Wenk, H. R.; Meisheng, H.
Page Count	8
Abstract	Achievement of atomic-resolution electron-beam tomography will allow determination of the three dimensional structure of nanoparticles (and other suitable specimens) at atomic resolution. Three dimensional reconstructions will yield 'section' images that resolve atoms overlapped in normal electron microscope images (projections), resolving lighter atoms such as oxygen in the presence of heavier atoms, and atoms that lie on non-lattice sites such as those in non-periodic defect structures.
Keywords	Electron microscopy Tomography Electron beam Atomic resolution Nanoparticles Three dimensional Diffraction
Source Agency	Technical Information Center Oak Ridge Tennessee
Corporate Authors	Lawrence Berkeley National Lab., CA.; Department of Energy, Washington, DC.
Supplemental Notes	Sponsored by Department of Energy, Washington, DC.
Document Type	Technical Report
NTIS Issue Number	200606

Atomic-Resolution 3D Electron Microscopy with Dynamic Diffraction.

Atomic-Resolution 3D Electron Microscopy with Dynamic Diffraction.
DE2005842049

Publication Date	2005
Personal Author	O'Keefe, M.; Downing, K. H.; Wenk, H. R.; Meisheng, H.
Page Count	8
Abstract	Achievement of atomic-resolution electron-beam tomography will allow determination of the three dimensional structure of nanoparticles (and other suitable specimens) at atomic resolution. Three dimensional reconstructions will yield 'section' images that resolve atoms overlapped in normal electron microscope images (projections), resolving lighter atoms such as oxygen in the presence of heavier atoms, and atoms that lie on non-lattice sites such as those in non-periodic defect structures.
Keywords	Electron microscopy Tomography Electron beam Atomic resolution Nanoparticles Three dimensional Diffraction
Source Agency	Technical Information Center Oak Ridge Tennessee
Corporate Authors	Lawrence Berkeley National Lab., CA.; Department of Energy, Washington, DC.
Supplemental Notes	Sponsored by Department of Energy, Washington, DC.
Document Type	Technical Report
NTIS Issue Number	200606