National Technical Reports Library - NTRL

National Technical Reports Library

The National Technical Information Service acquires, indexes, abstracts, and archives the largest collection of U.S. government-sponsored technical reports in existence. The NTRL offers online, free and open access to these authenticated government technical reports. Technical reports and documents in its repository may be available online for free either from the issuing federal agency, the U.S. Government Publishing Office’s Federal Digital System website, or through search engines.




Details
Actions:
Download PDFDownload PDF
Download

Characterization of SEI Layers on LiMn2O4 Cathodes with In situ Spectroscopic Ellipsometry.


DE2005837416

Publication Date 2005
Personal Author Lei, J.; Li, L.; Kostecki, R.; Muller, R.; McLarnon, F.
Page Count 28
Abstract In situ spectroscopic ellipsometry was employed to study the initial stage of SEI layer formation on thin-film LiMn(sub 2)O(sub 4) electrodes. It was found that the SEI layer formed immediately upon exposure of the electrode to EC/DMC (1:1 by vol) 1.0 M LiPF(sub 6) electrolyte. The SEI layer thickness then increased in proportion to a logarithmic function of elapsed time. In comparison, the SEI layer thickness on a cycled electrode increased in proportion to a linear function of the number of cycles.
Keywords
  • Cathodes
  • Ellipsometry
  • Electrodes
  • Thickness
  • Lithium
Source Agency
  • Technical Information Center Oak Ridge Tennessee
Corporate Authors Lawrence Berkeley National Lab., CA.; Department of Energy, Washington, DC.
Supplemental Notes Sponsored by Department of Energy, Washington, DC.
Document Type Technical Report
NTIS Issue Number 200520
Characterization of SEI Layers on LiMn2O4 Cathodes with In situ Spectroscopic Ellipsometry.
Characterization of SEI Layers on LiMn2O4 Cathodes with In situ Spectroscopic Ellipsometry.
DE2005837416

  • Cathodes
  • Ellipsometry
  • Electrodes
  • Thickness
  • Lithium
  • Technical Information Center Oak Ridge Tennessee
Loading