National Technical Reports Library - NTRL

National Technical Reports Library

The National Technical Information Service acquires, indexes, abstracts, and archives the largest collection of U.S. government-sponsored technical reports in existence. The NTRL offers online, free and open access to these authenticated government technical reports. Technical reports and documents in its repository may be available online for free either from the issuing federal agency, the U.S. Government Publishing Office’s Federal Digital System website, or through search engines.




Details
Actions:
Download PDFDownload PDF
Download

Ultraviolet Femtosecond and Nanosecond Laser Ablation of Silicon: Ablation Efficiency and Laser-Induced Plasma Expansion.


DE2005836676

Publication Date 2005
Personal Author Zong, X.; Mao, X.; Greif, R.; Russo, R. E.
Page Count 14
Abstract Femtosecond laser ablation of silicon in air was studied and compared with nanosecond laser ablation at ultraviolet wavelength (266 nm). Laser ablation efficiency was studied by measuring crater depth as a function of pulse number. For the same number of laser pulses, the fs-ablated crater was about two times deeper than the ns-crater. The temperature and electron number density of the pulsed laser-induced plasma were determined from spectroscopic measurements. The electron number density and temperature of fs-pulse plasmas decreased faster than ns-pulse plasmas due to different energy deposition mechanisms. Images of the laser-induced plasma were obtained with femtosecond time-resolved laser shadowgraph imaging. Plasma expansion in both the perpendicular and the lateral directions to the laser beam were compared for femtosecond and nanosecond laser ablation.
Keywords
  • Laser-induced plasma
  • Shock wave
  • Electrons
  • Plasma
  • Plasma expansion
  • Silicon
  • Laser ablation
  • Femtosecond pulses
Source Agency
  • Technical Information Center Oak Ridge Tennessee
Corporate Authors Lawrence Berkeley National Lab., CA.; Department of Energy, Washington, DC.
Supplemental Notes Sponsored by Department of Energy, Washington, DC.
Document Type Technical Report
NTIS Issue Number 200520
Ultraviolet Femtosecond and Nanosecond Laser Ablation of Silicon: Ablation Efficiency and Laser-Induced Plasma Expansion.
Ultraviolet Femtosecond and Nanosecond Laser Ablation of Silicon: Ablation Efficiency and Laser-Induced Plasma Expansion.
DE2005836676

  • Laser-induced plasma
  • Shock wave
  • Electrons
  • Plasma
  • Plasma expansion
  • Silicon
  • Laser ablation
  • Femtosecond pulses
  • Technical Information Center Oak Ridge Tennessee
Loading