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The National Technical Information Service acquires, indexes, abstracts, and archives the largest collection of U.S. government-sponsored technical reports in existence. The NTRL offers online, free and open access to these authenticated government technical reports. Technical reports and documents in its repository may be available online for free either from the issuing federal agency, the U.S. Government Publishing Office’s Federal Digital System website, or through search engines.

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X-Ray Backlighting for the National Ignition Facility.

DE200515013240

Publication Date	2000
Personal Author	Landen, O. L.; Fraley, D. R.; Glendinning, S. G.; Logory, L. M.; Bell, P. M.; Kich, J. A.; Lee, F. D.; Bradley, D. K.; Kalantar, D. H.; Back, C. A.; Turner, R. E.; Price, D. E.
Page Count	32
Abstract	X-ray backlighting is a powerful tool for diagnosing a large variety of high-energy-density phenomena. Traditional area backlighting techniques used at Nova and Omega cannot be extended efficiently to NIF-scale. New, more efficient backlighting sources and techniques are required and have begun to show promising results. These include a backlit-pinhole point-projection technique, pinhole and slit arrays, distributed polychromatic sources, and picketfence backlighters. In parallel, there have been developments in improving the data SNR and hence quality by switching from film to CCD-based recording media and by removing the fixed-pattern noise of MCP-based cameras.
Keywords	High energy physics Diagnostics Radiography High density National Ignition Facility X-ray backlighting
Source Agency	Technical Information Center Oak Ridge Tennessee
Corporate Authors	Lawrence Livermore National Lab., CA.; Department of Energy, Washington, DC.
Supplemental Notes	Sponsored by Department of Energy, Washington, DC.
Document Type	Technical Report
NTIS Issue Number	200519

X-Ray Backlighting for the National Ignition Facility.

X-Ray Backlighting for the National Ignition Facility.
DE200515013240

Publication Date	2000
Personal Author	Landen, O. L.; Fraley, D. R.; Glendinning, S. G.; Logory, L. M.; Bell, P. M.; Kich, J. A.; Lee, F. D.; Bradley, D. K.; Kalantar, D. H.; Back, C. A.; Turner, R. E.; Price, D. E.
Page Count	32
Abstract	X-ray backlighting is a powerful tool for diagnosing a large variety of high-energy-density phenomena. Traditional area backlighting techniques used at Nova and Omega cannot be extended efficiently to NIF-scale. New, more efficient backlighting sources and techniques are required and have begun to show promising results. These include a backlit-pinhole point-projection technique, pinhole and slit arrays, distributed polychromatic sources, and picketfence backlighters. In parallel, there have been developments in improving the data SNR and hence quality by switching from film to CCD-based recording media and by removing the fixed-pattern noise of MCP-based cameras.
Keywords	High energy physics Diagnostics Radiography High density National Ignition Facility X-ray backlighting
Source Agency	Technical Information Center Oak Ridge Tennessee
Corporate Authors	Lawrence Livermore National Lab., CA.; Department of Energy, Washington, DC.
Supplemental Notes	Sponsored by Department of Energy, Washington, DC.
Document Type	Technical Report
NTIS Issue Number	200519