National Technical Reports Library

The National Technical Information Service acquires, indexes, abstracts, and archives the largest collection of U.S. government-sponsored technical reports in existence. The NTRL offers online, free and open access to these authenticated government technical reports. Technical reports and documents in its repository may be available online for free either from the issuing federal agency, the U.S. Government Publishing Office’s Federal Digital System website, or through search engines.

Details

Warm, Dense Plasma Characterization by X-ray Thomson Scattering.

DE200515013191

Publication Date	2005
Personal Author	Landen, O. L.; Glenzer, S. H.; Cauble, R. C.; Lee, R. W.; Edwards, E.
Page Count	14
Abstract	We describe how the powerful technique of spectrally resolved Thomson scattering can be extended to the x-ray regime, for direct measurements of the ionization state, density, temperature, and the microscopic behavior of dense cool plasmas. Such a direct measurement of microscopic parameters of solid density plasmas could eventually be used to properly interpret laboratory measurements of material properties such as thermal and electrical conductivity, EUS and opacity. In addition, x-ray Thomson scattering will provide new information on the characteristics of rarely and hitherto difficult to diagnose Fermi degenerate and strongly coupled plasmas.
Keywords	X-rays Dense plasmas Ionization state Density Material properties Temperature Microscopic parameters Thompson scattering Compton scattering Strongly coupled plasmas
Source Agency	Technical Information Center Oak Ridge Tennessee
Corporate Authors	Lawrence Livermore National Lab., CA.; Department of Energy, Washington, DC.
Supplemental Notes	Sponsored by Department of Energy, Washington, DC.
Document Type	Technical Report
NTIS Issue Number	200602

Warm, Dense Plasma Characterization by X-ray Thomson Scattering.

Warm, Dense Plasma Characterization by X-ray Thomson Scattering.
DE200515013191

Publication Date	2005
Personal Author	Landen, O. L.; Glenzer, S. H.; Cauble, R. C.; Lee, R. W.; Edwards, E.
Page Count	14
Abstract	We describe how the powerful technique of spectrally resolved Thomson scattering can be extended to the x-ray regime, for direct measurements of the ionization state, density, temperature, and the microscopic behavior of dense cool plasmas. Such a direct measurement of microscopic parameters of solid density plasmas could eventually be used to properly interpret laboratory measurements of material properties such as thermal and electrical conductivity, EUS and opacity. In addition, x-ray Thomson scattering will provide new information on the characteristics of rarely and hitherto difficult to diagnose Fermi degenerate and strongly coupled plasmas.
Keywords	X-rays Dense plasmas Ionization state Density Material properties Temperature Microscopic parameters Thompson scattering Compton scattering Strongly coupled plasmas
Source Agency	Technical Information Center Oak Ridge Tennessee
Corporate Authors	Lawrence Livermore National Lab., CA.; Department of Energy, Washington, DC.
Supplemental Notes	Sponsored by Department of Energy, Washington, DC.
Document Type	Technical Report
NTIS Issue Number	200602