Publication Date |
2000 |
Personal Author |
Runkel, M.; Maricle, S.; Torres, R.; Auerbach, J.; Floyd, R.; Hawley-Fedder, R.; Burnham, A. K. |
Page Count |
18 |
Abstract |
This paper discusses the results of thermal annealing and in-situ second harmonic generation (SHG) damage tests performed on six rapid growth KDP type 1 doubler crystals at 1064 nm on the Zeus automated damage test facility. Unconditioned (S/1) and conditioned (R/l) damage probability tests were performed before and after thermal annealing, then with and without SHG on six doubler crystals from the NIF-size, rapid growth KDP boule F6. |
Keywords |
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Source Agency |
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Corporate Authors |
Lawrence Livermore National Lab., CA.; Department of Energy, Washington, DC. |
Supplemental Notes |
Sponsored by Department of Energy, Washington, DC. |
Document Type |
Technical Report |
NTIS Issue Number |
200522 |