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Effect of Thermal Annealing and Second Harmonic Generation on Bulk Damage Performance of Rapid-Growth KDP Type I Doublers at 1064 nm.


DE200515013174

Publication Date 2000
Personal Author Runkel, M.; Maricle, S.; Torres, R.; Auerbach, J.; Floyd, R.; Hawley-Fedder, R.; Burnham, A. K.
Page Count 18
Abstract This paper discusses the results of thermal annealing and in-situ second harmonic generation (SHG) damage tests performed on six rapid growth KDP type 1 doubler crystals at 1064 nm on the Zeus automated damage test facility. Unconditioned (S/1) and conditioned (R/l) damage probability tests were performed before and after thermal annealing, then with and without SHG on six doubler crystals from the NIF-size, rapid growth KDP boule F6.
Keywords
  • Annealing
  • Harmonic generation
  • Damage
  • Performance evaluation
  • Crystals
  • Tests
  • KDP type I doubler crystals
Source Agency
  • Technical Information Center Oak Ridge Tennessee
Corporate Authors Lawrence Livermore National Lab., CA.; Department of Energy, Washington, DC.
Supplemental Notes Sponsored by Department of Energy, Washington, DC.
Document Type Technical Report
NTIS Issue Number 200522
Effect of Thermal Annealing and Second Harmonic Generation on Bulk Damage Performance of Rapid-Growth KDP Type I Doublers at 1064 nm.
Effect of Thermal Annealing and Second Harmonic Generation on Bulk Damage Performance of Rapid-Growth KDP Type I Doublers at 1064 nm.
DE200515013174

  • Annealing
  • Harmonic generation
  • Damage
  • Performance evaluation
  • Crystals
  • Tests
  • KDP type I doubler crystals
  • Technical Information Center Oak Ridge Tennessee
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