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Limitations on the Use of Scanning Probe Microscopy for the Measurement of Field Emission from Cooper Surfaces.


DE2004826839

Publication Date 2003
Personal Author Mizuno, Y.; Kirby, R. E.
Page Count 76
Abstract No abstract available.
Keywords
  • Copper
  • Electric fields
  • Electron emission
  • Field emission
  • Linear colliders
  • Nitrogen
  • Oxides
  • Probes
  • Microscopy
Source Agency
  • Technical Information Center Oak Ridge Tennessee
Corporate Authors Stanford Linear Accelerator Center, CA.; Department of Energy, Washington, DC.
Supplemental Notes Sponsored by Department of Energy, Washington, DC.
Document Type Technical Report
NTIS Issue Number 200510
Limitations on the Use of Scanning Probe Microscopy for the Measurement of Field Emission from Cooper Surfaces.
Limitations on the Use of Scanning Probe Microscopy for the Measurement of Field Emission from Cooper Surfaces.
DE2004826839

  • Copper
  • Electric fields
  • Electron emission
  • Field emission
  • Linear colliders
  • Nitrogen
  • Oxides
  • Probes
  • Microscopy
  • Technical Information Center Oak Ridge Tennessee
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