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Testing of the TriP Chip Running at 132 nsec Using a Modified AFE Board.

DE2004820409

Publication Date	2003
Personal Author	Estrade, J.; Garcia, C.; Hoeneisenn, B.; Rubinov, P.
Page Count	10
Abstract	In this note we describe the first set of tests done with a sample of TriP chips that were mounted on a modified AFE board. The modifications consisted of different firmware and the replacement of one power supply switch. The board used was a standard AFEIc board (red type) on which new MCMs (MCMIIs) were mounted. The new MCMs were designed to support the TriP and emulate the SVX for readout when mounted on an AFEIc board. The TriP and the MCMs are described.
Keywords	Analog systems Coupling Discriminators Readout systems Substrates Design Availability Modifications Testing
Source Agency	Technical Information Center Oak Ridge Tennessee
Corporate Authors	Fermi National Accelerator Lab., Batavia, IL.; Department of Energy, Washington, DC.
Supplemental Notes	Sponsored by Department of Energy, Washington, DC.
Document Type	Technical Report
NTIS Issue Number	200412

Testing of the TriP Chip Running at 132 nsec Using a Modified AFE Board.

Testing of the TriP Chip Running at 132 nsec Using a Modified AFE Board.
DE2004820409

Publication Date	2003
Personal Author	Estrade, J.; Garcia, C.; Hoeneisenn, B.; Rubinov, P.
Page Count	10
Abstract	In this note we describe the first set of tests done with a sample of TriP chips that were mounted on a modified AFE board. The modifications consisted of different firmware and the replacement of one power supply switch. The board used was a standard AFEIc board (red type) on which new MCMs (MCMIIs) were mounted. The new MCMs were designed to support the TriP and emulate the SVX for readout when mounted on an AFEIc board. The TriP and the MCMs are described.
Keywords	Analog systems Coupling Discriminators Readout systems Substrates Design Availability Modifications Testing
Source Agency	Technical Information Center Oak Ridge Tennessee
Corporate Authors	Fermi National Accelerator Lab., Batavia, IL.; Department of Energy, Washington, DC.
Supplemental Notes	Sponsored by Department of Energy, Washington, DC.
Document Type	Technical Report
NTIS Issue Number	200412