National Technical Reports Library

The National Technical Information Service acquires, indexes, abstracts, and archives the largest collection of U.S. government-sponsored technical reports in existence. The NTRL offers online, free and open access to these authenticated government technical reports. Technical reports and documents in its repository may be available online for free either from the issuing federal agency, the U.S. Government Publishing Office’s Federal Digital System website, or through search engines.

Details

Conductive Atomic Force Microscopy Applied to CdTe/CdS Solar Cells.

DE200415009703

Publication Date	2004
Personal Author	Moutinho, H. R.; Dhere, R. G.; Jiang, C. S.; Al-Jassim, M. M.; Kazmerski, L. L.
Page Count	12
Abstract	In this work we describe for the first time the use of conductive atomic force microscopy (C-AFM) in the study of CdTe/CdS solar cells, before and after the etching processes used in device fabrication. C-AFM is a new technique that provides information on the electrical properties of the sample in conjunction with topographic images with high lateral resolution. At the same time, this technique allows for the generation of I-V curves at very well-defined locations. A potential is applied between the sample and a very sharp tip, which scans the sample in contact mode. The current images showed that different CdTe grains produce different contrast. Etching the CdTe with a bromine/methanol solution enhanced the current along grains boundaries when compared to the intragrain material. Etching with a solution of nitric and phosphoric acids did not show this effect. Instead, it increased the current through the whole sample surface.
Keywords	Cadmium sulfide solar cells Cadmium telluride solar cells Electron microscopy Etching Electrical properties Fabrication Solar cells Phosphoric acid Resolution Solar energy Photovoltaics Conductive atomic force microscopy(C-AFM)
Source Agency	Technical Information Center Oak Ridge Tennessee
Corporate Authors	National Renewable Energy Lab., Golden, CO.; Department of Energy, Washington, DC.
Supplemental Notes	Sponsored by Department of Energy, Washington, DC.
Document Type	Technical Report
NTIS Issue Number	200515

Conductive Atomic Force Microscopy Applied to CdTe/CdS Solar Cells.

Conductive Atomic Force Microscopy Applied to CdTe/CdS Solar Cells.
DE200415009703

Publication Date	2004
Personal Author	Moutinho, H. R.; Dhere, R. G.; Jiang, C. S.; Al-Jassim, M. M.; Kazmerski, L. L.
Page Count	12
Abstract	In this work we describe for the first time the use of conductive atomic force microscopy (C-AFM) in the study of CdTe/CdS solar cells, before and after the etching processes used in device fabrication. C-AFM is a new technique that provides information on the electrical properties of the sample in conjunction with topographic images with high lateral resolution. At the same time, this technique allows for the generation of I-V curves at very well-defined locations. A potential is applied between the sample and a very sharp tip, which scans the sample in contact mode. The current images showed that different CdTe grains produce different contrast. Etching the CdTe with a bromine/methanol solution enhanced the current along grains boundaries when compared to the intragrain material. Etching with a solution of nitric and phosphoric acids did not show this effect. Instead, it increased the current through the whole sample surface.
Keywords	Cadmium sulfide solar cells Cadmium telluride solar cells Electron microscopy Etching Electrical properties Fabrication Solar cells Phosphoric acid Resolution Solar energy Photovoltaics Conductive atomic force microscopy(C-AFM)
Source Agency	Technical Information Center Oak Ridge Tennessee
Corporate Authors	National Renewable Energy Lab., Golden, CO.; Department of Energy, Washington, DC.
Supplemental Notes	Sponsored by Department of Energy, Washington, DC.
Document Type	Technical Report
NTIS Issue Number	200515