National Technical Reports Library

The National Technical Information Service acquires, indexes, abstracts, and archives the largest collection of U.S. government-sponsored technical reports in existence. The NTRL offers online, free and open access to these authenticated government technical reports. Technical reports and documents in its repository may be available online for free either from the issuing federal agency, the U.S. Government Publishing Office’s Federal Digital System website, or through search engines.

Details

Novel Integrating Solid State Detector with Segmentation for Scanning Transmission Soft X-Ray Microscopy.

DE200415006568

Publication Date	2001
Personal Author	Feser, M.; Jacobsen, C.; Rehak, P.; De Geronimo, G.; Holl, P.; Struder, L.
Page Count	14
Abstract	An integrating solid state detector with segmentation has been developed that addresses the needs in scanning transmission x-ray microscopy below 1 keV photon energy. The detector is not cooled and can be operated without an entrance window which leads to a total photon detection efficiency close to 100%. The chosen segmentation with 8 independent segments is matched to the geometry of the STXM to maximize image mode flexibility. In the bright field configuration for 1 ms integration time and 520 eV x-rays the rms noise is 8 photons per integration.
Keywords	Radiation detectors X-Ray equipment Microscopes X-Ray detection Design Photons Scanning
Source Agency	Technical Information Center Oak Ridge Tennessee
Corporate Authors	State Univ. of New York at Stony Brook. Dept. of Physics and Astronomy.; Brookhaven National Lab., Upton, NY.; Department of Energy, Washington, DC.; Max-Planck-Inst. fuer Extraterrestrische Physik, Garching (Germany,
Supplemental Notes	Prepared in cooperation with Brookhaven National Lab., Upton, NY. and Max-Planck-Inst. fuer Extraterrestrische Physik, Garching (Germany, F.R.). Sponsored by Department of Energy, Washington, DC.
Document Type	Technical Report
NTIS Issue Number	200418

Novel Integrating Solid State Detector with Segmentation for Scanning Transmission Soft X-Ray Microscopy.

Novel Integrating Solid State Detector with Segmentation for Scanning Transmission Soft X-Ray Microscopy.
DE200415006568

Publication Date	2001
Personal Author	Feser, M.; Jacobsen, C.; Rehak, P.; De Geronimo, G.; Holl, P.; Struder, L.
Page Count	14
Abstract	An integrating solid state detector with segmentation has been developed that addresses the needs in scanning transmission x-ray microscopy below 1 keV photon energy. The detector is not cooled and can be operated without an entrance window which leads to a total photon detection efficiency close to 100%. The chosen segmentation with 8 independent segments is matched to the geometry of the STXM to maximize image mode flexibility. In the bright field configuration for 1 ms integration time and 520 eV x-rays the rms noise is 8 photons per integration.
Keywords	Radiation detectors X-Ray equipment Microscopes X-Ray detection Design Photons Scanning
Source Agency	Technical Information Center Oak Ridge Tennessee
Corporate Authors	State Univ. of New York at Stony Brook. Dept. of Physics and Astronomy.; Brookhaven National Lab., Upton, NY.; Department of Energy, Washington, DC.; Max-Planck-Inst. fuer Extraterrestrische Physik, Garching (Germany,
Supplemental Notes	Prepared in cooperation with Brookhaven National Lab., Upton, NY. and Max-Planck-Inst. fuer Extraterrestrische Physik, Garching (Germany, F.R.). Sponsored by Department of Energy, Washington, DC.
Document Type	Technical Report
NTIS Issue Number	200418