National Technical Reports Library

The National Technical Information Service acquires, indexes, abstracts, and archives the largest collection of U.S. government-sponsored technical reports in existence. The NTRL offers online, free and open access to these authenticated government technical reports. Technical reports and documents in its repository may be available online for free either from the issuing federal agency, the U.S. Government Publishing Office’s Federal Digital System website, or through search engines.

Details

Material Microcharacterization Collaboratory.

DE2003807949

Publication Date	2003
Personal Author	Mabon, J. C.; Metze, G.; Petrov, I.
Page Count	29
Abstract	The Center for Microanalysis of Materials (CMM) is a user-oriented and user-friendly facility that provides the modern analytical capabilities essential to today's materials science. The Center is an integral part of the Frederick Seitz Materials Research Laboratory on the campus of the University of Illinois at Urbana-Champaign. The CMM emphasizes the microstructural and microchemical composition of materials; chemistry and electronics of surfaces; crystal structures; phase transitions and defect structures of materials; the relationship between structure and properties of solids. By using the center, materials researchers can access over 30 major instruments in the areas of electron microscopy, scanning probes, surface microanalysis, X-ray diffraction, and back-scattering spectroscopy's. The breadth of instrumentation available through the center enables researchers to find the best combination of analytical techniques for their specific needs.
Keywords	Microanalysis Materials tests Micromagnetic properties Microchemical properties Electron microscopy X ray diffraction Spectroscopy Surface chemistry Phase transitions Crystal structure Chemical properties Defects Backscattering
Source Agency	Technical Information Center Oak Ridge Tennessee
Corporate Authors	Illinois Univ. at Urbana-Champaign.; Department of Energy, Washington, DC.
Supplemental Notes	Sponsored by Department of Energy, Washington, DC.
Document Type	Technical Report
NTIS Issue Number	200323

Material Microcharacterization Collaboratory.

Material Microcharacterization Collaboratory.
DE2003807949

Publication Date	2003
Personal Author	Mabon, J. C.; Metze, G.; Petrov, I.
Page Count	29
Abstract	The Center for Microanalysis of Materials (CMM) is a user-oriented and user-friendly facility that provides the modern analytical capabilities essential to today's materials science. The Center is an integral part of the Frederick Seitz Materials Research Laboratory on the campus of the University of Illinois at Urbana-Champaign. The CMM emphasizes the microstructural and microchemical composition of materials; chemistry and electronics of surfaces; crystal structures; phase transitions and defect structures of materials; the relationship between structure and properties of solids. By using the center, materials researchers can access over 30 major instruments in the areas of electron microscopy, scanning probes, surface microanalysis, X-ray diffraction, and back-scattering spectroscopy's. The breadth of instrumentation available through the center enables researchers to find the best combination of analytical techniques for their specific needs.
Keywords	Microanalysis Materials tests Micromagnetic properties Microchemical properties Electron microscopy X ray diffraction Spectroscopy Surface chemistry Phase transitions Crystal structure Chemical properties Defects Backscattering
Source Agency	Technical Information Center Oak Ridge Tennessee
Corporate Authors	Illinois Univ. at Urbana-Champaign.; Department of Energy, Washington, DC.
Supplemental Notes	Sponsored by Department of Energy, Washington, DC.
Document Type	Technical Report
NTIS Issue Number	200323