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Multi-Element Si Sensor with Readout Asic for EXAFS Spectroscopy.

DE2003807518

Publication Date	2002
Personal Author	De Geonimo, G.; O'Conner, P.; Beuttenmuller, R. H.; Li, Z.; Kuczewski, A. J.; Siddons, D. P.
Page Count	11
Abstract	Extended X-ray Absorption Fine Structure (EXAFS) experiments impose stringent requirements on a detection system, due to the need for processing ionizing events at a high rate, typically above of 10Mcps/cm2, and with a high resolution, typically better than 300eV. The detection system here presented is being developed targeting these stringent requirements. It is the result of a cooperation between the Instrumentation Division and the National Synchrotron Light Source (NSLS) of the Brookhaven National Laboratoiy (BNL). The system is composed of a multi-element Si sensor with dedicated per pixel electronics. The combination of high rate, high resolution and moderate complexity makes this system attractive when compared to other multi-element solutions. In sections 2, 3 and 4 the sensor, the interconnect and the electronics are briefly described. Section 5 reports on the first experimental results.
Keywords	Sensors X-ray spectroscopy Absorption spectroscopy Bond angle Chemical bonds Energy dependence Readout ASIC
Source Agency	Technical Information Center Oak Ridge Tennessee
Corporate Authors	Brookhaven National Lab., Upton, NY.; Department of Energy, Washington, DC.
Supplemental Notes	Sponsored by Department of Energy, Washington, DC.
Document Type	Technical Report
NTIS Issue Number	200321

Multi-Element Si Sensor with Readout Asic for EXAFS Spectroscopy.

Multi-Element Si Sensor with Readout Asic for EXAFS Spectroscopy.
DE2003807518

Publication Date	2002
Personal Author	De Geonimo, G.; O'Conner, P.; Beuttenmuller, R. H.; Li, Z.; Kuczewski, A. J.; Siddons, D. P.
Page Count	11
Abstract	Extended X-ray Absorption Fine Structure (EXAFS) experiments impose stringent requirements on a detection system, due to the need for processing ionizing events at a high rate, typically above of 10Mcps/cm2, and with a high resolution, typically better than 300eV. The detection system here presented is being developed targeting these stringent requirements. It is the result of a cooperation between the Instrumentation Division and the National Synchrotron Light Source (NSLS) of the Brookhaven National Laboratoiy (BNL). The system is composed of a multi-element Si sensor with dedicated per pixel electronics. The combination of high rate, high resolution and moderate complexity makes this system attractive when compared to other multi-element solutions. In sections 2, 3 and 4 the sensor, the interconnect and the electronics are briefly described. Section 5 reports on the first experimental results.
Keywords	Sensors X-ray spectroscopy Absorption spectroscopy Bond angle Chemical bonds Energy dependence Readout ASIC
Source Agency	Technical Information Center Oak Ridge Tennessee
Corporate Authors	Brookhaven National Lab., Upton, NY.; Department of Energy, Washington, DC.
Supplemental Notes	Sponsored by Department of Energy, Washington, DC.
Document Type	Technical Report
NTIS Issue Number	200321