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Mitigation of Copper Corrosion and Agglomeration in APS Process Water Systems.

DE200344298

Publication Date	2002
Personal Author	Dortwegt, R.; Putman, C.; Swetin, E.
Page Count	11
Abstract	Copper corrosion has been observed in process water (PW) systems at the Advanced Photon Source (APS) dating to the early postcommissioning phase of the project. In time, copper corrosion products agglomerated significantly in certain preferred locations. Significant agglomerations (or deposits) can occur in copper cooling passages such as magnet conductors and x-ray absorbers having relatively large length-to-diameter ratios and where heat is removed by water cooling. Such agglomerations also occur at restrictions found in noncopper system components such as valve seats, fixed orifices, pump seal faces, etc. Modifications to the APS process water system that significantly reduce the rate of copper corrosion are discussed. These modifications have not prevented corrosion altogether, however. Other means used to prevent component clogging and malfunction as a result of current copper corrosion rates are listed.
Keywords	Advanced photon source Corrosion Agglomeration Copper corrosion Process water systems
Source Agency	Technical Information Center Oak Ridge Tennessee
Corporate Authors	Argonne National Lab., IL. Advanced Photon Source Accelerator Systems Div.; Department of Energy, Washington, DC.
Supplemental Notes	Sponsored by Department of Energy, Washington, DC.
Document Type	Technical Report
NTIS Issue Number	200324

Mitigation of Copper Corrosion and Agglomeration in APS Process Water Systems.

Mitigation of Copper Corrosion and Agglomeration in APS Process Water Systems.
DE200344298

Publication Date	2002
Personal Author	Dortwegt, R.; Putman, C.; Swetin, E.
Page Count	11
Abstract	Copper corrosion has been observed in process water (PW) systems at the Advanced Photon Source (APS) dating to the early postcommissioning phase of the project. In time, copper corrosion products agglomerated significantly in certain preferred locations. Significant agglomerations (or deposits) can occur in copper cooling passages such as magnet conductors and x-ray absorbers having relatively large length-to-diameter ratios and where heat is removed by water cooling. Such agglomerations also occur at restrictions found in noncopper system components such as valve seats, fixed orifices, pump seal faces, etc. Modifications to the APS process water system that significantly reduce the rate of copper corrosion are discussed. These modifications have not prevented corrosion altogether, however. Other means used to prevent component clogging and malfunction as a result of current copper corrosion rates are listed.
Keywords	Advanced photon source Corrosion Agglomeration Copper corrosion Process water systems
Source Agency	Technical Information Center Oak Ridge Tennessee
Corporate Authors	Argonne National Lab., IL. Advanced Photon Source Accelerator Systems Div.; Department of Energy, Washington, DC.
Supplemental Notes	Sponsored by Department of Energy, Washington, DC.
Document Type	Technical Report
NTIS Issue Number	200324