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National Technical Reports Library

The National Technical Information Service acquires, indexes, abstracts, and archives the largest collection of U.S. government-sponsored technical reports in existence. The NTRL offers online, free and open access to these authenticated government technical reports. Technical reports and documents in its repository may be available online for free either from the issuing federal agency, the U.S. Government Publishing Office’s Federal Digital System website, or through search engines.




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Integration of a hard x-ray microprobe with a diffractometer for microdiffraction..


DE2002789684

Publication Date 2001
Personal Author Libera, J.; Cai, Z.; Lai, B.; Xu, S.
Page Count 12
Abstract No abstract prepared.
Keywords
  • Diffractometers
  • Focusing
  • X-ray diffraction
  • Nondestructive analysis
  • Hard x radiation
  • Microanalysis
  • Microdiffraction
  • X ray microprobes
Source Agency
  • Technical Information Center Oak Ridge Tennessee
Corporate Authors Argonne National Lab., IL.; Department of Energy, Washington, DC.
Document Type Conference Proceedings
NTIS Issue Number 200212
Contract Number
  • W-31-109-ENG-38
Integration of a hard x-ray microprobe with a diffractometer for microdiffraction..
Integration of a hard x-ray microprobe with a diffractometer for microdiffraction..
DE2002789684

  • Diffractometers
  • Focusing
  • X-ray diffraction
  • Nondestructive analysis
  • Hard x radiation
  • Microanalysis
  • Microdiffraction
  • X ray microprobes
  • Technical Information Center Oak Ridge Tennessee
  • W-31-109-ENG-38
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