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Photothermal Stability of an E-Beam Pre-Crosslinked EVA Encapsulant and Its Performance Degradation on a-Si Submodules: Preprint.


DE200215000039

Publication Date 2001
Personal Author Pern, F. J.; Watson, G. L.; Glick, S. H.; Raaff, J.
Page Count 4
Abstract Presented at the 2001 NCPV Program Review Meeting: Study of photothermal stability of special EVA encapsulant by accelerated exposure testing and analysis of causes of performance degradation on a-Si modules.
Keywords
  • Meetings
  • Photothermal properties
  • Accelerated tests
  • Stability
  • Degradation
  • Performance tests
  • Silicon
  • Amorphous materials
  • Adhesion
  • Thin films
  • Encapsulation
  • Ethylene-vinyl acetate
Source Agency
  • Technical Information Center Oak Ridge Tennessee
Corporate Authors National Renewable Energy Lab., Golden, CO.; Department of Energy, Washington, DC.
Document Type Conference Proceedings
NTIS Issue Number 200212
Contract Number
  • AC36-99-GO10337
Photothermal Stability of an E-Beam Pre-Crosslinked EVA Encapsulant and Its Performance Degradation on a-Si Submodules: Preprint.
Photothermal Stability of an E-Beam Pre-Crosslinked EVA Encapsulant and Its Performance Degradation on a-Si Submodules: Preprint.
DE200215000039

  • Meetings
  • Photothermal properties
  • Accelerated tests
  • Stability
  • Degradation
  • Performance tests
  • Silicon
  • Amorphous materials
  • Adhesion
  • Thin films
  • Encapsulation
  • Ethylene-vinyl acetate
  • Technical Information Center Oak Ridge Tennessee
  • AC36-99-GO10337
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