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Nondestructive Characterization of Atomic Density Profile in CdS/Zn2SnO4 Junctions by X-Ray Fluoresence: Preprint.


DE200215000037

Publication Date 2001
Personal Author Kim, S.; Soo, Y. L.; Kioseoglou, G.; Kao, Y. H.; Wu, X.
Page Count 4
Abstract Presented at the 2001 NCPV Program Review Meeting: Atomic density profile of selected atomic species in series of CdS/Zn2SnO4 junctions were studied by ADXRF.
Keywords
  • Meetings
  • X-ray flourescence
  • Annealing
  • Junctions
  • Heat treatment
  • Solar cells
  • Nondestructive tests
  • Thin films
  • Zinc compounds
  • Atomic density
  • Angular Dependence of X-ray fluorescence
Source Agency
  • Technical Information Center Oak Ridge Tennessee
Corporate Authors National Renewable Energy Lab., Golden, CO.; Department of Energy, Washington, DC.
Document Type Conference Proceedings
NTIS Issue Number 200212
Contract Number
  • AC36-99-GO10337
Nondestructive Characterization of Atomic Density Profile in CdS/Zn2SnO4 Junctions by X-Ray Fluoresence: Preprint.
Nondestructive Characterization of Atomic Density Profile in CdS/Zn2SnO4 Junctions by X-Ray Fluoresence: Preprint.
DE200215000037

  • Meetings
  • X-ray flourescence
  • Annealing
  • Junctions
  • Heat treatment
  • Solar cells
  • Nondestructive tests
  • Thin films
  • Zinc compounds
  • Atomic density
  • Angular Dependence of X-ray fluorescence
  • Technical Information Center Oak Ridge Tennessee
  • AC36-99-GO10337
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