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Analysis of Nitrogen Incorporation in Group III-Nitride-Arsenide Materials Using a Magnetic Sector Secondary-Ion Mass Spectrometry (SIMS) Instrument: Preprint.


DE200215000027

Publication Date 2001
Personal Author Reedy, R. C.
Page Count 4
Abstract Presented at the 2001 NCPV Program Review Meeting: Group III-nitride-arsenide materials were studied by SIMS, XRD, and Profiler to determine small amounts of nitrogen that can lower the alloys bandgap significantly.
Keywords
  • Meetings
  • Nitrogen
  • Solar cells
  • Alloys
  • Mass spectroscopy
  • Nitrides
  • Arsenides
  • Secondary-ion mass spectrometery(SIMS)
Source Agency
  • Technical Information Center Oak Ridge Tennessee
Corporate Authors National Renewable Energy Lab., Golden, CO.; Department of Energy, Washington, DC.
Document Type Conference Proceedings
NTIS Issue Number 200212
Contract Number
  • AC36-99-GO10337
Analysis of Nitrogen Incorporation in Group III-Nitride-Arsenide Materials Using a Magnetic Sector Secondary-Ion Mass Spectrometry (SIMS) Instrument: Preprint.
Analysis of Nitrogen Incorporation in Group III-Nitride-Arsenide Materials Using a Magnetic Sector Secondary-Ion Mass Spectrometry (SIMS) Instrument: Preprint.
DE200215000027

  • Meetings
  • Nitrogen
  • Solar cells
  • Alloys
  • Mass spectroscopy
  • Nitrides
  • Arsenides
  • Secondary-ion mass spectrometery(SIMS)
  • Technical Information Center Oak Ridge Tennessee
  • AC36-99-GO10337
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