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Generation and Use of Coherent Transition Radiation from Short Electron Bunches.

DE2001787223

Publication Date	2001
Personal Author	Settakorn, C.
Page Count	183
Abstract	This thesis concentrates on coherent transition and diffraction from short electron bunches as a potential high intensity far-infrared radiation source and for sub-picosecond electron bunch length measurements. Coherent transition radiation generated from a 25 MeV beam at a vacuum-metal interface is characterized. Such a high intensity radiation source allows far-infrared spectroscopy to be conducted conveniently with a Michelson interferometer and a room temperature detector. Measurements of the refractive index of silicon are described to demonstrate the possibilities of far-infrared spectroscopy using coherent transition radiation. Coherent diffraction radiation, which is closely related to coherent transition radiation, can be considered as another potential FIR radiation source. Since the perturbation by the radiation generation to the electron beam is relatively small, its has the advantage of being a nondestructive radiation source.
Keywords	Radiation sources Electron beams Beam bunches Electron sources Interferometer Refractive index Transition radiation Detectors
Source Agency	Technical Information Center Oak Ridge Tennessee
Corporate Authors	Stanford Linear Accelerator Center, CA.; Department of Energy, Oak Ridge, TN.
Document Type	Technical Report
NTIS Issue Number	200205
Contract Number	AC03-76SF00515

Generation and Use of Coherent Transition Radiation from Short Electron Bunches.

Generation and Use of Coherent Transition Radiation from Short Electron Bunches.
DE2001787223

Publication Date	2001
Personal Author	Settakorn, C.
Page Count	183
Abstract	This thesis concentrates on coherent transition and diffraction from short electron bunches as a potential high intensity far-infrared radiation source and for sub-picosecond electron bunch length measurements. Coherent transition radiation generated from a 25 MeV beam at a vacuum-metal interface is characterized. Such a high intensity radiation source allows far-infrared spectroscopy to be conducted conveniently with a Michelson interferometer and a room temperature detector. Measurements of the refractive index of silicon are described to demonstrate the possibilities of far-infrared spectroscopy using coherent transition radiation. Coherent diffraction radiation, which is closely related to coherent transition radiation, can be considered as another potential FIR radiation source. Since the perturbation by the radiation generation to the electron beam is relatively small, its has the advantage of being a nondestructive radiation source.
Keywords	Radiation sources Electron beams Beam bunches Electron sources Interferometer Refractive index Transition radiation Detectors
Source Agency	Technical Information Center Oak Ridge Tennessee
Corporate Authors	Stanford Linear Accelerator Center, CA.; Department of Energy, Oak Ridge, TN.
Document Type	Technical Report
NTIS Issue Number	200205
Contract Number	AC03-76SF00515