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In situ biaxial texture analysis of mgo films during growth on amorphous substrates by ion beam-assisted deposition.

DE2001781254

Publication Date	2001
Personal Author	Brewer, R. T.; Arendt, P. N.
Page Count	7
Abstract	We used a previously reported kinematical electron scattering model 1 to develop a RHEED based method for performing quantitative analysis of mosaic polycrystalline thin film in-plane and out-of-plain grain orientation distributions. RHEED based biaxial texture measurements are compared to X-Ray and transmission electron microscopy measurements to establish the validity of the RHEED analysis method. In situ RHEED analysis reveals that the out of plane orientation distribution starts out very broad, and then decreases during IBAD MgO growth. Other results included evidence that the in-plane orientation distribution narrows, the grain size increases, and the film roughens as film thickness increases during IBAD MgO growth. Homoepitaxy of MgO improves the biaxial texture of the IBAD layer, making X-ray measurements of IBAD films with an additional homoepitaxial layer not quantitatively representative of the IBAD layer. Systematic offsets between RHEED analysis and X-ray measurements of biaxial texture, coupled with evidence that biaxial texture improves with increasing film thickness, indicate that RHEED is a superior technique for probing surface biaxial texture.
Keywords	Texture analysis Substrates Deposition Ion beams In situ Biaxial MGO films
Source Agency	Technical Information Center Oak Ridge Tennessee
NTIS Subject Category	46D - Solid State Physics 99F - Physical & Theoretical Chemistry
Corporate Authors	Los Alamos National Lab., NM.; Department of Energy, Washington, DC.
Document Type	Conference Proceedings
NTIS Issue Number	200210
Contract Number	W-7405-ENG-36

In situ biaxial texture analysis of mgo films during growth on amorphous substrates by ion beam-assisted deposition.

In situ biaxial texture analysis of mgo films during growth on amorphous substrates by ion beam-assisted deposition.
DE2001781254

Publication Date	2001
Personal Author	Brewer, R. T.; Arendt, P. N.
Page Count	7
Abstract	We used a previously reported kinematical electron scattering model 1 to develop a RHEED based method for performing quantitative analysis of mosaic polycrystalline thin film in-plane and out-of-plain grain orientation distributions. RHEED based biaxial texture measurements are compared to X-Ray and transmission electron microscopy measurements to establish the validity of the RHEED analysis method. In situ RHEED analysis reveals that the out of plane orientation distribution starts out very broad, and then decreases during IBAD MgO growth. Other results included evidence that the in-plane orientation distribution narrows, the grain size increases, and the film roughens as film thickness increases during IBAD MgO growth. Homoepitaxy of MgO improves the biaxial texture of the IBAD layer, making X-ray measurements of IBAD films with an additional homoepitaxial layer not quantitatively representative of the IBAD layer. Systematic offsets between RHEED analysis and X-ray measurements of biaxial texture, coupled with evidence that biaxial texture improves with increasing film thickness, indicate that RHEED is a superior technique for probing surface biaxial texture.
Keywords	Texture analysis Substrates Deposition Ion beams In situ Biaxial MGO films
Source Agency	Technical Information Center Oak Ridge Tennessee
NTIS Subject Category	46D - Solid State Physics 99F - Physical & Theoretical Chemistry
Corporate Authors	Los Alamos National Lab., NM.; Department of Energy, Washington, DC.
Document Type	Conference Proceedings
NTIS Issue Number	200210
Contract Number	W-7405-ENG-36