National Technical Reports Library

The National Technical Information Service acquires, indexes, abstracts, and archives the largest collection of U.S. government-sponsored technical reports in existence. The NTRL offers online, free and open access to these authenticated government technical reports. Technical reports and documents in its repository may be available online for free either from the issuing federal agency, the U.S. Government Publishing Office’s Federal Digital System website, or through search engines.

Details

Scanning Nearfield Infrared Microscopy.

DE2001781121

Publication Date	2001
Personal Author	Gillman, E.
Page Count	5
Abstract	Commonly, location specific chemical identification by means of vibrational spectroscopy in the infrared region is largely restricted to samples of macroscopic dimensions, on the order of one to several microns; the scale of the examined area is completely determined by the diffraction limit of the incident radiation. However, chemical identification at length scales less than the diffraction limit is possible using a scanned probe technique, the Scanning Near-Field Infrared Microscope (SNFIM). Using a scanned probe technique in the near-field, resolution of chemical features on the order of h/20 or (approximately) 100 nm can be achieved. An overview of previous experimental results using a free electron laser (FEL) and more conventional infrared sources will be discussed. Recent results from the SNFIM experiment at Jefferson Lab will also be presented.
Keywords	Free electron lasers Infrared radiation Diffraction Microscopes Microscopy Probes Spatial resolution
Source Agency	Technical Information Center Oak Ridge Tennessee
Corporate Authors	Thomas Jefferson National Accelerator Facility, Newport News, VA.; Department of Energy, Washington, DC.
Document Type	Conference Proceedings
NTIS Issue Number	200125
Contract Number	AC05-84ER40150

Scanning Nearfield Infrared Microscopy.

Scanning Nearfield Infrared Microscopy.
DE2001781121

Publication Date	2001
Personal Author	Gillman, E.
Page Count	5
Abstract	Commonly, location specific chemical identification by means of vibrational spectroscopy in the infrared region is largely restricted to samples of macroscopic dimensions, on the order of one to several microns; the scale of the examined area is completely determined by the diffraction limit of the incident radiation. However, chemical identification at length scales less than the diffraction limit is possible using a scanned probe technique, the Scanning Near-Field Infrared Microscope (SNFIM). Using a scanned probe technique in the near-field, resolution of chemical features on the order of h/20 or (approximately) 100 nm can be achieved. An overview of previous experimental results using a free electron laser (FEL) and more conventional infrared sources will be discussed. Recent results from the SNFIM experiment at Jefferson Lab will also be presented.
Keywords	Free electron lasers Infrared radiation Diffraction Microscopes Microscopy Probes Spatial resolution
Source Agency	Technical Information Center Oak Ridge Tennessee
Corporate Authors	Thomas Jefferson National Accelerator Facility, Newport News, VA.; Department of Energy, Washington, DC.
Document Type	Conference Proceedings
NTIS Issue Number	200125
Contract Number	AC05-84ER40150