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Evaluation of Creep Property of AS800 Silicon Nitride from As-Processed Surface Regions.


DE2001777690

Publication Date 2001
Personal Author Lin, H. T.
Page Count 8
Abstract Tensile creep studies were carried out to evaluate the creep performance of AS800 silicon nitride samples extracted from the surface and bulk regions of as-processed billets at 1350 C in air. The objective of this study was to understand the creep properties of the silicon nitride in the as-processed surface region and determine if they are comparable to those obtained from the bulk region. The results indicated that samples from the as-processed surface region exhibited higher creep rates and shorter lifetimes as compared with those obtained from the bulk region. The poor creep performance of material from the as-processed surface region was due to the higher content of glassy phase enriched with oxygen and sintering additive elements.
Keywords
  • Creep
  • Silicon nitrides
  • Surface
  • Tensile properties
  • Performance
  • Phase studies
Source Agency
  • Technical Information Center Oak Ridge Tennessee
Corporate Authors Oak Ridge National Lab., TN.; Department of Energy, Washington, DC.
Document Type Conference Proceedings
NTIS Issue Number 200125
Contract Number
  • AC05-96OR22464
Evaluation of Creep Property of AS800 Silicon Nitride from As-Processed Surface Regions.
Evaluation of Creep Property of AS800 Silicon Nitride from As-Processed Surface Regions.
DE2001777690

  • Creep
  • Silicon nitrides
  • Surface
  • Tensile properties
  • Performance
  • Phase studies
  • Technical Information Center Oak Ridge Tennessee
  • AC05-96OR22464
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