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Alpha Particle Time of Flight Measurements on a new class of CdZnTe Radiation Detectors.


DE2001769325

Publication Date 2000
Personal Author Erickson, J. C.; Yao, H. W.; James, R. B.; Olsen, R.; Li, L.; Lu, F.
Page Count 17
Abstract A time of flight technique was used to study the carrier trapping time, t, and mobility, in various CdZnTe (CZT) radiation detectors. A new class of CZT crystals doped with various elements, grown by a modified Bridgman method at Yirmel Tech, were fabricated into detectors. The charge transport properties and performance were tested and compared with CZT detectors grown using the more mature high pressure method. The crystals under study were single crystal in nature some, being large volume. Both thermally evaporated and electroless gold contacts were used in the study. Carriers were generated near the surface of the detector by an (241)Am source producing a flood field of 5.5 MeV alpha particles. Voltage signals from generated electrons or holes were analyzed to determine the trapping time and mobility of carriers independently.
Keywords
  • Radiation detectors
  • Alpha particles
  • Chemistry
  • Physics
  • Time measurement
Source Agency
  • Technical Information Center Oak Ridge Tennessee
Corporate Authors Sandia National Labs., Albuquerque, NM.; Department of Energy, Washington, DC.
Document Type Conference Proceedings
NTIS Issue Number 200124
Contract Number
  • AC04-94AL85000
Alpha Particle Time of Flight Measurements on a new class of CdZnTe Radiation Detectors.
Alpha Particle Time of Flight Measurements on a new class of CdZnTe Radiation Detectors.
DE2001769325

  • Radiation detectors
  • Alpha particles
  • Chemistry
  • Physics
  • Time measurement
  • Technical Information Center Oak Ridge Tennessee
  • AC04-94AL85000
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