| Publication Date |
2000 |
| Personal Author |
Truchan, T. G.; Rountree, F. H.; Lanagan, M. T.; McClellan, S. M.; Miller, D. J. |
| Page Count |
7 |
| Abstract |
Polycrystalline Ni has been used as a substrate for high-current, coated YBa(sub 2)Cu(sub 3)O(sub x) superconductors. For many conductors, Ni is rolled to large deformation and annealed to produce a cube texture. In this study, Ni was rolled to greater than 95% reduction and annealed in 5% H(sub 2)/95% He at 300-1000 C for various times. The resulting substrates were examined by scanning electron microscopy, X-ray and electron diffraction, and surface interferometry. Key determinations for the Ni were extent of in-plane and out-of-plane texture, surface smoothness, and grain size. The extent of texture was approximately independent of annealing temperature and increased slightly with annealing time. Annealing at temperatures greater than 600 C increased surface roughness, primarily due to grain-boundary grooving. Grain growth was fastest at 1000 C and was proportional to time to the 0.1 power. |
| Keywords |
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| Source Agency |
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| Corporate Authors |
Argonne National Lab., IL.; Department of Energy, Washington, DC. |
| Document Type |
Conference Proceedings |
| NTIS Issue Number |
200125 |
| Contract Number |
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