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Diagnostic Concept for High-Resolution Temporal Profile Measurements.

DE141149348

Publication Date	2011
Personal Author	Andonian, G.; Hemsing, E.; Musumeci, P.; O Shea, F.; Rosenzweig, J.; Murokh, A.; Xiang, D.; Pogorelski, I.; Yakimenko, V.
Page Count	3
Abstract	The diagnosis of the temporal profile and length of high brightness electron beams is very important in advanced accelerator facilities and next generation light sources. A novel diagnostic scheme to reach temporal resolutions exceeding 1 femtosecond has been studied recently (1). The scheme entails imposing an angular modulation on the electron beam by interaction with a high power laser in an undulator field. A subsequent deflection in the orthogonal dimension, provided by an RF cavity, generates a streak on a downstream screen. The observable pattern is now correlated to the beam longitudinal profile. In this paper, we present a test case for this scheme using the parameters of the Brookhaven National Laboratory Accelerator Test Facility (BNL ATF). The components of the proof-of principle experiment are presented.
Keywords	Beam profiles Accelerators Brightness Diagnosis Electron beams Lasers Light sources Rf systems
Source Agency	Technical Information Center Oak Ridge Tennessee
NTIS Subject Category	46 - Physics
Corporate Authors	Stanford Linear Accelerator Center, CA.; Department of Energy, Washington, DC.
Supplemental Notes	Sponsored by Department of Energy, Washington, DC.
Document Type	Technical Report
NTIS Issue Number	201503
Contract Number	DE-AC02-76SF00515

Diagnostic Concept for High-Resolution Temporal Profile Measurements.

Diagnostic Concept for High-Resolution Temporal Profile Measurements.
DE141149348

Publication Date	2011
Personal Author	Andonian, G.; Hemsing, E.; Musumeci, P.; O Shea, F.; Rosenzweig, J.; Murokh, A.; Xiang, D.; Pogorelski, I.; Yakimenko, V.
Page Count	3
Abstract	The diagnosis of the temporal profile and length of high brightness electron beams is very important in advanced accelerator facilities and next generation light sources. A novel diagnostic scheme to reach temporal resolutions exceeding 1 femtosecond has been studied recently (1). The scheme entails imposing an angular modulation on the electron beam by interaction with a high power laser in an undulator field. A subsequent deflection in the orthogonal dimension, provided by an RF cavity, generates a streak on a downstream screen. The observable pattern is now correlated to the beam longitudinal profile. In this paper, we present a test case for this scheme using the parameters of the Brookhaven National Laboratory Accelerator Test Facility (BNL ATF). The components of the proof-of principle experiment are presented.
Keywords	Beam profiles Accelerators Brightness Diagnosis Electron beams Lasers Light sources Rf systems
Source Agency	Technical Information Center Oak Ridge Tennessee
NTIS Subject Category	46 - Physics
Corporate Authors	Stanford Linear Accelerator Center, CA.; Department of Energy, Washington, DC.
Supplemental Notes	Sponsored by Department of Energy, Washington, DC.
Document Type	Technical Report
NTIS Issue Number	201503
Contract Number	DE-AC02-76SF00515