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Details

Advanced Technology Component Derating.

ADA253334

Publication Date	1992
Personal Author	Jennings, T. A.
Page Count	204
Abstract	This report has been prepared to summarize the technical study performed to determine the derating criteria of advanced technology components. The study covered existing criteria from AFSC Pamphlet 800-27 and the development of new criteria based on data, literature searches and the use of advanced technology prediction methods developed in RADC-TR-90-72. The devices that were investigated were: VHSIC, ASIC, MIMIC, Microprocessor, PROM, Power Transistors, RF Pulse Transistors, RF Multi-Transistor Packages, Photo Diodes, Photo Transistors, Opto-Electronic Couplers, Injection Laser Diodes, LED, Hybrid Deposited Film Resistors, Chip Resistors and Capacitors and SAW devices. The results of the study are additional derating criteria that extend the range of AFSC Pamphlet 800-27. These data will be transitioned from the report to AFSC Pamphlet 800-27 for use by government and contractor personnel in derating electronics systems yielding increased safety margins and improved system reliability. Reliability, VHSIC, Galium Arsenide (GaAs), Failure Rate, Derating.
Keywords	Electronics Stress analysis Standardization Capacitors Couplers Diodes Failure Film resistors Injection lasers Microprocessors Predictions Reliability Resistors Safety Transistors Stress testing Thermal stresses Mechanical properties Electrical properties Derating
Source Agency	Non Paid ADAS
NTIS Subject Category	49 - Electrotechnology
Corporate Authors	Westinghouse Electronic Systems Group, Baltimore, MD.
Document Type	Technical Report
Title Note	Final rept. Jun 89-Sep 91.
NTIS Issue Number	199222
Contract Number	F30602-89-C-0095

Advanced Technology Component Derating.

Advanced Technology Component Derating.
ADA253334

Publication Date	1992
Personal Author	Jennings, T. A.
Page Count	204
Abstract	This report has been prepared to summarize the technical study performed to determine the derating criteria of advanced technology components. The study covered existing criteria from AFSC Pamphlet 800-27 and the development of new criteria based on data, literature searches and the use of advanced technology prediction methods developed in RADC-TR-90-72. The devices that were investigated were: VHSIC, ASIC, MIMIC, Microprocessor, PROM, Power Transistors, RF Pulse Transistors, RF Multi-Transistor Packages, Photo Diodes, Photo Transistors, Opto-Electronic Couplers, Injection Laser Diodes, LED, Hybrid Deposited Film Resistors, Chip Resistors and Capacitors and SAW devices. The results of the study are additional derating criteria that extend the range of AFSC Pamphlet 800-27. These data will be transitioned from the report to AFSC Pamphlet 800-27 for use by government and contractor personnel in derating electronics systems yielding increased safety margins and improved system reliability. Reliability, VHSIC, Galium Arsenide (GaAs), Failure Rate, Derating.
Keywords	Electronics Stress analysis Standardization Capacitors Couplers Diodes Failure Film resistors Injection lasers Microprocessors Predictions Reliability Resistors Safety Transistors Stress testing Thermal stresses Mechanical properties Electrical properties Derating
Source Agency	Non Paid ADAS
NTIS Subject Category	49 - Electrotechnology
Corporate Authors	Westinghouse Electronic Systems Group, Baltimore, MD.
Document Type	Technical Report
Title Note	Final rept. Jun 89-Sep 91.
NTIS Issue Number	199222
Contract Number	F30602-89-C-0095