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Determination of the Optical Properties of Organic Thin Films by Spectroscopic Ellipsometry.

ADA230427

Publication Date	1990
Personal Author	Sward, M. L.
Page Count	97
Abstract	This theses demonstrated the feasibility of determining the optical properties of organic and polymer thin films through the use of Spectroscopic Ellipsometry (SE). Tan Psi and cos Delta data from 300-800 nanometers (NM) were taken with a Rudolph Research s2000 spectroscopic ellipsometer four samples: indium tin oxide (ITO) coated glass; five layer poly-benzyl-L glutamate (PBLG) organic film on ITO coated glass; eight layer PBLG film on ITO coated glass; and a thiophene polymer film on a microscope slide. The data sets were fit to a choice of four computer models based on a paper written by Dwight Berreman in 1972. The four were written in MATLAB to take advantage of its matrix manipulative capabilities. The models were: a single layer isotropic film on an isotropic substrate; a single layer anisotropic film on an isotropic substrate; two isotropic films on an isotropic substrate; and two anisotropic fims on an isotropic substrate. Using only tan Psi data over a restricted wavelength region, all four data sets were fit to variances of 0.01 or less. (JHD)
Keywords	Ellipsometers Polymeric films Anisotropy Coatings Complementary metal oxide semiconductors Computerized simulation Data bases Films Frequency Glass Indium compounds Isotropism Layers Limitations Optical properties Organic materials Oxides Regions Spectroscopy Substrates Thin films Thiophenes Tin compounds Ellispsometry Organic thin films Polymer Theses
Source Agency	Non Paid ADAS
NTIS Subject Category	99C - Polymer Chemistry
Corporate Authors	Air Force Inst. of Tech., Wright-Patterson AFB, OH. School of Engineering.
Document Type	Thesis
Title Note	Master's thesis.
NTIS Issue Number	199112

Determination of the Optical Properties of Organic Thin Films by Spectroscopic Ellipsometry.

Determination of the Optical Properties of Organic Thin Films by Spectroscopic Ellipsometry.
ADA230427

Publication Date	1990
Personal Author	Sward, M. L.
Page Count	97
Abstract	This theses demonstrated the feasibility of determining the optical properties of organic and polymer thin films through the use of Spectroscopic Ellipsometry (SE). Tan Psi and cos Delta data from 300-800 nanometers (NM) were taken with a Rudolph Research s2000 spectroscopic ellipsometer four samples: indium tin oxide (ITO) coated glass; five layer poly-benzyl-L glutamate (PBLG) organic film on ITO coated glass; eight layer PBLG film on ITO coated glass; and a thiophene polymer film on a microscope slide. The data sets were fit to a choice of four computer models based on a paper written by Dwight Berreman in 1972. The four were written in MATLAB to take advantage of its matrix manipulative capabilities. The models were: a single layer isotropic film on an isotropic substrate; a single layer anisotropic film on an isotropic substrate; two isotropic films on an isotropic substrate; and two anisotropic fims on an isotropic substrate. Using only tan Psi data over a restricted wavelength region, all four data sets were fit to variances of 0.01 or less. (JHD)
Keywords	Ellipsometers Polymeric films Anisotropy Coatings Complementary metal oxide semiconductors Computerized simulation Data bases Films Frequency Glass Indium compounds Isotropism Layers Limitations Optical properties Organic materials Oxides Regions Spectroscopy Substrates Thin films Thiophenes Tin compounds Ellispsometry Organic thin films Polymer Theses
Source Agency	Non Paid ADAS
NTIS Subject Category	99C - Polymer Chemistry
Corporate Authors	Air Force Inst. of Tech., Wright-Patterson AFB, OH. School of Engineering.
Document Type	Thesis
Title Note	Master's thesis.
NTIS Issue Number	199112