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Storage Reliability Analysis Summary Report. Volume II. Electro Mechanical Devices.

ADA122440

Publication Date	1982
Personal Author	Smith, H. B.; Krulac, I. L.
Page Count	83
Abstract	This document summarizes storage reliability data collected by the US Army Missile Command on electro-mechanical devices over a period of several years. Sources of data are detailed, major failure modes and mechanisms are listed and discussed. Non-operational failure rate prediction methodology is given, and conclusions and recommendations for enhancing the storage reliability of devices are drawn from the analysis of collected data. (Author)
Keywords	Guided missile components Reliability Electromechanical devices Storage Mathematical models Accelerated testing Aging(Materials) Accelerometers Switches Relays Gyroscopes Shelf life Failure Data bases Data reduction Pressure switches Electric contacts Electric motors Generators Synchros Quality assurance Predictions Materiel Life cycles Life cycle testing Test methods Failure rates Failure mechanisms Missile reliabilty Rate gyroscopes Failure modes Resolvers Failure analysis
Source Agency	Non Paid ADAS
NTIS Subject Category	75 - Missile Technology 74E - Logistics, Military Facilities, & Supplies
Corporate Authors	Raytheon Co., Huntsville, AL. Life Cycle Analysis Group.; Shared Bibliographic Input.
Supplemental Notes	Report on Storage Reliability of Missile Materiel Program. See also Volume 3, AD-A122 194. Updates LC-78-2-Vol-2, AD-A053 408.
Document Type	Technical Report
Title Note	Final rept. Sep 80-Sep 82.
NTIS Issue Number	198308
Contract Number	DAAH01-80-D-0020

Storage Reliability Analysis Summary Report. Volume II. Electro Mechanical Devices.

Storage Reliability Analysis Summary Report. Volume II. Electro Mechanical Devices.
ADA122440

Publication Date	1982
Personal Author	Smith, H. B.; Krulac, I. L.
Page Count	83
Abstract	This document summarizes storage reliability data collected by the US Army Missile Command on electro-mechanical devices over a period of several years. Sources of data are detailed, major failure modes and mechanisms are listed and discussed. Non-operational failure rate prediction methodology is given, and conclusions and recommendations for enhancing the storage reliability of devices are drawn from the analysis of collected data. (Author)
Keywords	Guided missile components Reliability Electromechanical devices Storage Mathematical models Accelerated testing Aging(Materials) Accelerometers Switches Relays Gyroscopes Shelf life Failure Data bases Data reduction Pressure switches Electric contacts Electric motors Generators Synchros Quality assurance Predictions Materiel Life cycles Life cycle testing Test methods Failure rates Failure mechanisms Missile reliabilty Rate gyroscopes Failure modes Resolvers Failure analysis
Source Agency	Non Paid ADAS
NTIS Subject Category	75 - Missile Technology 74E - Logistics, Military Facilities, & Supplies
Corporate Authors	Raytheon Co., Huntsville, AL. Life Cycle Analysis Group.; Shared Bibliographic Input.
Supplemental Notes	Report on Storage Reliability of Missile Materiel Program. See also Volume 3, AD-A122 194. Updates LC-78-2-Vol-2, AD-A053 408.
Document Type	Technical Report
Title Note	Final rept. Sep 80-Sep 82.
NTIS Issue Number	198308
Contract Number	DAAH01-80-D-0020