National Technical Reports Library - NTRL

National Technical Reports Library

The National Technical Information Service acquires, indexes, abstracts, and archives the largest collection of U.S. government-sponsored technical reports in existence. The NTRL offers online, free and open access to these authenticated government technical reports. Technical reports and documents in its repository may be available online for free either from the issuing federal agency, the U.S. Government Publishing Office’s Federal Digital System website, or through search engines.




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A Test Procedure for Short-Life Rating of Composition Resistors.


AD018756

Publication Date 1953
Personal Author Bridges, D. B. J.; Graham, J. H.; Sackett, W. T.
Page Count 10
Abstract No abstract available.
Keywords
  • Electronic equipment
  • Resistors
  • Life expectancy
  • Test methods
Source Agency
  • Non Paid Delimited ADS
  • Invalid Source Agency Code
Corporate Authors Battelle Memorial Inst., Columbus, OH.
Document Type Technical Report
NTIS Issue Number 198107
Contract Number
  • AF33 038 1229
A Test Procedure for Short-Life Rating of Composition Resistors.
A Test Procedure for Short-Life Rating of Composition Resistors.
AD018756

  • Electronic equipment
  • Resistors
  • Life expectancy
  • Test methods
  • Non Paid Delimited ADS
  • Invalid Source Agency Code
  • AF33 038 1229
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